| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_73ebc284a55d5daf0e209d6186c9e65c |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B8-4444 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B8-0891
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B8-4427
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N30-20
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B8-44
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B8-4494
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B8-14
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N30-07
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B06B1-0629
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N30-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N30-088
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B8-4444
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N30-072
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03H9-05
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N30-2041
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N30-2042
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N30-10513 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B8-14
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L41-113
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04R31-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L41-09
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04R17-00 |
| filingDate |
2015-11-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e9226c471b822c1790f11eb14db2c61c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fb0de79e456d77c2e47e1ca8d99edde5 |
| publicationDate |
2017-06-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
JP-2017098781-A |
| titleOfInvention |
Piezoelectric element, ultrasonic probe, ultrasonic measuring device, and method of manufacturing piezoelectric element |
| abstract |
A piezoelectric element in which variation in performance due to anisotropy of a silicon wafer is suppressed is provided. A piezoelectric element is formed by laminating a piezoelectric body and a vibration plate 53 using single crystal silicon having a plane orientation of [111] as a vibration material. Also, a method for manufacturing a piezoelectric element includes a step of cutting a vibration material used for the vibration plate 53 from a single crystal silicon wafer having a plane orientation of [111] and a step of laminating the piezoelectric body and the vibration plate. . [Selection] Figure 11 |
| priorityDate |
2015-11-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |