http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2017072842-A

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_44ff3005508304394801e265e503b811
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F1-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F1-58
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filingDate 2016-11-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9b82192c6ec4bd1e0336a3d612e2de7e
publicationDate 2017-04-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2017072842-A
titleOfInvention Photomask manufacturing method, photomask, pattern transfer method, and flat panel display manufacturing method
abstract Provided are a photomask having a transfer pattern and a method of manufacturing the same, in which alignment of each region is accurately performed in a photomask that needs to be drawn a plurality of times, and the number of executions of a photolithography process can be suppressed. A step of preparing a blank on which a first resist film is formed by laminating a lower layer film and an upper layer film having different exposure light transmittances and having etching selectivity on a transparent substrate; A first resist pattern forming step for forming a film pattern and a temporary pattern, a first etching step for etching the upper layer film using the first resist pattern as a mask, a second resist film forming step on the entire surface, and a second drawing are performed. A second resist pattern forming step for forming a lower layer film pattern, a second etching step for etching the lower layer film using the temporary pattern and the second resist pattern as a mask, and a second step for etching and removing the temporary pattern using the second resist pattern as a mask. 3 manufacturing process. [Selection] Figure 7
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-102461906-B1
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priorityDate 2016-11-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 31.