http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2017026446-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_f4a8faea375370b67c9d71e67db32bcd |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-338 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-778 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-812 |
| filingDate | 2015-07-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_faeb15f3552b1dd7930a7271833f2e9e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0dba7feb404ea59b16e214c3d780a06d |
| publicationDate | 2017-02-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2017026446-A |
| titleOfInvention | Measuring method of current collapse |
| abstract | The present invention provides a method for quantitatively measuring a current collapse phenomenon of a field effect nitride transistor as an electrical characteristic value (dynamic characteristic) unique to a device. (1) A predetermined voltage Vds is applied between a source electrode and a drain electrode, and a reverse bias is applied between the gate electrode and the source electrode so as to be in a predetermined OFF time toff and OFF state. (2) First measurement time t1 during the transition period from the time of the change in (1) until the voltage Vds becomes stable, and a second measurement after the first measurement time. The voltage Vds at the time point t2 is measured and the difference [Vds (t1) −Vds (t2)] is calculated. The conditions (3), (1), and (2) are set to be constant, and then the field-effect nitriding The measurement of (2) is performed a plurality of times with different temperature conditions of the physical transistor, and the change characteristic of the difference with respect to the temperature is obtained as the current collapse characteristic. [Selection] Figure 1 |
| priorityDate | 2015-07-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 19.