http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2016046392-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c186e9ae8cafab5df5c8d80cfa7b0fa1 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-72 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01F6-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01B13-00 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01F6-06 |
| filingDate | 2014-08-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9e22061b6a13091e5c32e6c5c02f181d http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ba20bd24508e2048142f304ae1167d79 |
| publicationDate | 2016-04-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2016046392-A |
| titleOfInvention | Superconducting wire inspection method and inspection apparatus, and superconducting wire manufacturing method |
| abstract | An inspection method and an inspection apparatus for non-destructively inspecting the possibility of peeling of a superconducting film in a superconducting wire, and a manufacturing method capable of manufacturing a superconducting wire having high reliability with a high yield. A method for inspecting a superconducting wire having a superconducting material layer formed on a substrate applies a magnetic field in a direction intersecting the surface of the superconducting wire cooled to a superconducting state, and the magnetic field and the superconducting material layer are separated from each other. The process of generating a peeling stress between the substrate and the superconducting material layer by interaction with the flowing shielding current, the process of measuring the superconducting characteristic of the superconducting wire after the peeling stress is applied, and the superconducting characteristic of the superconducting wire And a step of detecting a defective portion where the superconducting property is deteriorated in the superconducting material layer based on the measurement result. [Selection] Figure 8 |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2018136258-A |
| priorityDate | 2014-08-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID453284447 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID82899 |
Total number of triples: 18.