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filingDate 2015-01-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2015-08-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2015154078-A
titleOfInvention Method for manufacturing gate insulating layer
abstract The present invention provides a method for manufacturing a gate insulating layer that achieves both the stability of TFT (Thin Film Transistor) and the antistatic performance. Using a chemical vapor deposition method, a silicon nitride layer and a silicon oxide layer are sequentially deposited on a Cu gate to obtain a gate insulating layer in which the silicon nitride layer and the silicon oxide layer are sequentially stacked. Process. The silicon nitride layer effectively blocks oxygen to prevent Cu gate oxidation, and the silicon oxide layer effectively blocks hydrogen to prevent reduction of the active semiconductor layer.
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