http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2015145818-A

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_12d24c0a12c3ecdb6d9a47d623d96e76
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01F38-12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01T2-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2014-02-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1a575bc42f04ba7e3de339cb3c9d91d0
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c9d0c571792805c732b1767fa1915f56
publicationDate 2015-08-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2015145818-A
titleOfInvention Inspection apparatus and inspection method for semiconductor device
abstract Disclosed is a low-cost inspection device and inspection method for a semiconductor device, which has a small deviation voltage of a discharge voltage and can inspect a surge voltage tolerance with high accuracy. An inspection apparatus (100) includes a first main electrode (17), a second main electrode (19), an auxiliary electrode (20), a suction device (21), and a radius of curvature r1 of a spherical surface at the tip of each main electrode (17, 19, 21). By setting the positional relationship between r2, r3 and each main electrode to a predetermined value, the deviation voltage of the discharge voltage is small, and a low-cost semiconductor device inspection device capable of inspecting the surge voltage tolerance with high accuracy and its An inspection method can be provided. [Selection] Figure 1
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108181512-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108181512-A
priorityDate 2014-02-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 17.