| abstract |
A semiconductor device capable of reducing the size of an area of a circuit that is not required during normal operation is provided. A first circuit and a second circuit, wherein the first circuit includes first data including a history of whether or not a branch condition of a branch instruction is satisfied, and the branch. A third circuit for storing one or a plurality of sets of the first address corresponding to the instruction, a fourth circuit for comparing the second address of the instruction with the first address, and a result of the comparison And a fifth circuit that selects one set of the first data from the set or sets, wherein the second circuit is connected to each other and the logic of the input signal. The logic value of the output signal with respect to the value is controlled according to the second data, thereby generating a signal for testing the operation of the first circuit, and after the operation is tested according to the signal, Along with the second circuit, it has a function of storing one or a plurality of the sets. A semiconductor device having a circuit of the plurality of sixth. [Selection] Figure 1 |