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filingDate 2014-06-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2014-11-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2014209644-A
titleOfInvention Method for manufacturing semiconductor device
abstract An object is to form a single crystal semiconductor layer having a large area over a large insulating substrate. A large-sized insulating substrate is formed by forming a first porous layer and a second porous layer on a side surface of a single crystal semiconductor ingot, and forming a groove and a single crystal semiconductor layer on a part of the second porous layer. A method for forming a single crystal semiconductor layer, in which a single crystal semiconductor ingot is bonded to the interface, a water jet is applied to the interface between the first porous layer and the second porous layer, and the single crystal semiconductor layer is bonded to a large insulating substrate. Alternatively, the crystalline semiconductor ingot is irradiated with hydrogen ions, a hydrogen ion irradiation region is formed in the crystalline semiconductor ingot, and the crystalline semiconductor ingot is rotated on a large insulating substrate while being heated, and the crystallinity starts from the hydrogen ion irradiation region. The present invention relates to a method for forming a crystalline semiconductor layer in which a semiconductor layer is separated and attached to a large insulating substrate. [Selection] Figure 1
priorityDate 2007-10-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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