http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2014122958-A
Outgoing Links
Predicate | Object |
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assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1af8df51ce24ca931ae718fb747f6aa0 |
classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03G2215-0129 |
classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03G15-162 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03G15-16 |
filingDate | 2012-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_816467813f51763b9c3607472fcac60c http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_08c20005d726d95a8ea0f3293a81507e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_06040ba357f259d9a477e68da9dab0d7 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1b869af66064b29a9e50fe58ec20e794 |
publicationDate | 2014-07-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | JP-2014122958-A |
titleOfInvention | Image forming apparatus |
abstract | An image forming apparatus capable of further suppressing image defects when an intermediate transfer member includes a conductive material having ionic conductivity. A resistance difference is provided between a resistance ρprobe measured with a metal probe and a resistance ρsputter measured with a sputtering electrode by forming minute irregularities on the surface of the intermediate transfer belt. That is, the apparent resistance to the transfer material is kept high while the material resistance is kept low. Further, the resistance difference (ΔM) between ρprobe and ρsputter is made larger than the amount obtained by subtracting the image margin (ΔI) from the environmental variation (ΔE) of the resistance. [Selection] Figure 11 |
priorityDate | 2012-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 40.