Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_f575e2ca79bfdcf9993ab0fe45b1cac1 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_989ee3a3ef4c217a77a82ab3370a6ce0 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1af8df51ce24ca931ae718fb747f6aa0 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-60 |
filingDate |
2012-07-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0bc8031cfcd82dda0472ba8a2daa47ca http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_df775745a69b5c842c0d4e2d8e5ae640 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_02c989af20e98528a79923fa078d38a3 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3b44cd15ec0c916ed2b7e928847db4fa http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2870e04dfb56804c8d6b0e5ff74a56c6 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_cefe4c4072328fcb60bf8f64f2008360 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_79345a4dd2f7690a8e736cfa2b157029 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9b5a2fb9d08a991c9bc21a9a29279801 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_11d43edb02dbcefae73a3bb8af8f666b |
publicationDate |
2014-01-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
JP-2014016178-A |
titleOfInvention |
Charge amount measuring method and measuring apparatus |
abstract |
Charge amount measuring method and measuring apparatus capable of measuring a charge amount by friction between a powder and a sample plate by giving a desired amount of charge to the powder, and particularly desired over the entire surface of the powder particles having a resin outer shell layer. A charge amount measuring method and a measuring apparatus capable of measuring triboelectric charge by applying the above charge amount. After applying a voltage by passing a powder 3 between parallel plate electrodes 5 to which voltage is applied in a thin layer state, the powder is brought into contact with a sample plate 1 and the powder generated after the contact or The charge amount of the sample plate is measured. [Selection] Figure 1 |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2023061176-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10739394-B2 |
priorityDate |
2012-07-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |