http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2013511146-A
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2933-0041 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L33-507 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L33-50 |
| filingDate | 2010-09-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2013-03-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2013511146-A |
| titleOfInvention | Light emitting diode repair method and apparatus using quantum dot coating |
| abstract | The present invention measures the light emission characteristic value of the manufactured light emitting diode, and coats the light emitting diode classified according to the light emitting characteristic grade with a quantum dot mixed solution to form a quantum dot layer, thereby improving the light emission hue and luminance. The present invention relates to a method and an apparatus for repairing a light emitting diode capable of repairing an improved non-defective light emitting diode and improving the production yield. The method for repairing a light emitting diode according to the present invention measures a light emission characteristic value of the light emitting diode, determines a light emission grade for the measured light emission characteristic value, and determines a repair quantum dot corresponding to the light emission grade. A second step and a third step of forming a quantum dot layer corresponding to the repair quantum dot on the uppermost layer of the light emitting diode. |
| priorityDate | 2009-11-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 17.