http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2013149759-A

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L49-00
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filingDate 2012-01-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3b06fb952994e17879effde5390fb2aa
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publicationDate 2013-08-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2013149759-A
titleOfInvention Nonvolatile memory cell, nonvolatile memory device including the same, and method of selecting transition metal oxide
abstract [PROBLEMS] To establish an operation mechanism as the main theory of ReRAM based on quantum mechanics, and to find a new and accurate design principle, so that rewriting speed is faster than expected and high-capacity data is highly reliable. ReRAM that can be handled is provided at a high yield. In a nonvolatile memory cell according to the present invention, by applying a voltage between the first electrode and the second electrode, around the oxygen vacancy 2 arranged in an HfO 2 layer or a CoO layer, The CoO layer or the HfO 2 layer is arranged so that a conduction path 3 for conducting electrons is formed from the first electrode toward the second electrode. [Selection] Figure 16
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113488589-A
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