http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2013148433-A

Outgoing Links

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_399d433982220f3203f7f18db8c9aa28
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
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filingDate 2012-01-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_daab810c9ed8fef211a780e7d5eea1df
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publicationDate 2013-08-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2013148433-A
titleOfInvention Contact probe and probe unit
abstract To provide a contact probe and a probe unit capable of obtaining reliable and good conduction between contact objects while reducing the pitch, having high durability and heat resistance by repeated use, and having a spring property. . A first contact portion that contacts an electrode of one substrate, a second contact portion that contacts an electrode of the other substrate, a first contact portion, and a connection portion that connects the second contact portion, in the thickness direction Provided at the end portion on the side different from the connection side of the conducting portion provided with a through-hole penetrating through, the elastic portion elastically deformed by the load applied to the first contact portion and the second contact portion, and the connecting portion of the elastic portion And projecting in the opposite direction to the second contact portion side, attached to a probe holder for holding the contact probe, and filled in the through-hole and having a higher electrical conductivity than the material used for at least the conducting portion And a filling portion made of a conductive material. [Selection] Figure 1
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2022161096-A1
priorityDate 2012-01-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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Total number of triples: 24.