| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_04d903d3b8f8c5e0bb3e799da36a7e2a |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E60-10 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H02J7-0014 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M4-58
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H02J7-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-0525
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-44
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H02J7-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-48 |
| filingDate |
2012-08-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_cf02d01938d97d8e4fcd32e4ec4b7ad9 |
| publicationDate |
2013-04-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
JP-2013070599-A |
| titleOfInvention |
State management device and method for equalizing storage elements |
| abstract |
A technique for uniformly charging a plurality of secondary batteries is provided. A BMS 20 is a device for managing the state of a plurality of secondary batteries 50 connected in series, and includes a voltmeter 24 that individually measures a voltage value V of the secondary battery 50, and any one of them. Timekeeping that measures the time difference from when the time change rate of the voltage value V of the secondary battery 50 reaches the reference value K until the time change rate of the voltage value V of the other secondary battery 50 reaches the reference value K Unit 42, discharge circuit 26 that discharges secondary battery 50 individually, and equalization control unit 44 that controls discharge circuit 26 using the time difference. According to this BMS 20, even when the SOC charged in the storage element cannot be equalized by the voltage value of the storage element, the SOC charged in the storage element is equalized based on the time change rate of the voltage of the storage element. can do. [Selection] Figure 1 |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2017162721-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2018060641-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114089203-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-109888870-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-107895819-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2018526955-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9970992-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11235682-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-107757411-A |
| priorityDate |
2011-09-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |