http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2012150026-A

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filingDate 2011-01-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2012-08-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2012150026-A
titleOfInvention Elemental quantitative analysis method and elemental quantitative analyzer by X-ray absorption edge method
abstract [PROBLEMS] To use a relatively simple continuous X-ray light source without using a large-scale device such as a synchrotron radiation device (high energy electron storage ring), and to determine the average density and total amount of each element contained in a measured object. Provided are a quantitative analysis method capable of nondestructive measurement, and an elemental quantitative analysis apparatus capable of implementing such a quantitative analysis method. A carbon-based cold cathode electron source is made of a conductive light element having an atomic number smaller than that of titanium. Electrons emitted from the cold cathode electron source are incident on an incident surface and are forward X with respect to the incident direction. X-ray absorption of an object to be measured using a continuous X-ray light source including a target that emits a ray, a shielding member that shields X-rays other than the X-ray generated by the target, and an energy discrimination detector Calculate the absorption edge jump amount of each element in the spectrum, and based on the mass absorption edge jump coefficient for each element and the absorption edge jump amount of each element contained in advance in the standard sample, etc. The surface density on the X-ray transmission path is measured at the same time. [Selection] Figure 1
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