Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d78fe473c8a29219129bbc8bb50f6a59 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02532 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0262 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-31111 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02658 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02532 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-31111 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02554 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02052 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02381 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02293 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76254 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02636 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0262 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02658 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02164 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-12 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-20 |
filingDate |
2010-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f1923e3aa507cd4831f336fb03f689b9 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8cd812480f3d63636b047bea9869968c http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3c9b13ef0dcb14801e6fb28eadacfd23 |
publicationDate |
2012-07-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
JP-2012134242-A |
titleOfInvention |
Manufacturing method of SOI wafer |
abstract |
A method for manufacturing an SOI wafer having a desired SOI layer thickness by performing epitaxial growth on an SOI wafer without a silicon oxide film on a terrace portion manufactured by ion implantation and peeling without causing a valley-shaped step. An object of the present invention is to provide a process for removing an outer peripheral portion of a buried oxide film so that an outer peripheral edge of an SOI layer of the SOI wafer is positioned outside the outer peripheral edge of the buried oxide film. After that, after heat-treating the SOI wafer in a reducing atmosphere containing hydrogen or in an atmosphere containing hydrogen chloride gas, an SOI wafer manufacturing method for forming an epitaxial layer on the surface of the SOI layer. [Selection] Figure 1 |
priorityDate |
2010-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |