http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2012117926-A
Outgoing Links
Predicate | Object |
---|---|
assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5d610873487d2bc9668c04d7c2ec8e6c |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-64 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-62 |
filingDate | 2010-12-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5b15dc79f709db10b758974d4865f5ea |
publicationDate | 2012-06-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | JP-2012117926-A |
titleOfInvention | Analysis method of isotope concentration |
abstract | An object of the present invention is to provide an isotope concentration analysis method capable of obtaining accurate measurement data while suppressing the influence of residual moisture in an ion source in mass spectrometry employing an electron ionization method as an ionization method. A sample is introduced into an ion source, ionized by an electron ionization method, and subjected to mass spectrometry to obtain a stable isotope concentration of a specific element in the sample together with the sample. An inert gas, for example, at least one of helium, nitrogen, argon, neon, krypton and xenon is simultaneously introduced. [Selection] Figure 1 |
isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-103499633-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2021522650-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-7295743-B2 |
priorityDate | 2010-12-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 60.