| abstract |
An intensity change can be reliably obtained in each pixel, and a good phase contrast image can always be obtained. An X-ray source (11), first and second absorption gratings (31, 32), and a flat panel detector (FPD) (30) are provided. In this X-ray imaging system, a phase contrast image of the subject H is acquired by performing imaging while moving the mold grating 32 in the x direction. The period of the first pattern image at the position of the second absorption type grating 32 is p 1 ′, the substantial grating pitch of the second absorption type grating 32 is p 2 ′, and the X-ray light receiving region of each pixel of the FPD 30 the size of the x-direction in the case of the D X, and satisfies the following expression. Here, n is a positive integer. D X ≠ n × (p 1 ′ × p 2 ′) / | p 1 ′ −p 2 ′ | [Selection] Figure 5 |