http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2012042283-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_294881271413951a95f284b588a68e66 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E10-542 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H02S50-10 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L31-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M14-00 |
| filingDate | 2010-08-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_16285c2c9ecda185161d3a7ca3383889 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bfafdc0013e96476aa706cba270cecc0 |
| publicationDate | 2012-03-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2012042283-A |
| titleOfInvention | Inspection method and inspection apparatus |
| abstract | An object of the present invention is to provide an inspection method and an inspection apparatus capable of inspecting the quality of a dye-sensitized solar cell during the production of the dye-sensitized solar cell. An inspection object (a dye-sensitized solar cell after an electrode process) includes a transparent substrate and a cell structure (one or more) formed on the transparent substrate. The cell structure 10 includes a transparent electrode layer 1, a porous semiconductor layer 2, a porous semiconductor layer 2, and a counter electrode layer 4. An operator brings the probe 31 connected to the impedance measuring instrument 30 into contact with the transparent electrode layer 1 and measures the impedance of the cell structure 10 by AC impedance measurement. When the difference between the measured impedance and the reference impedance is equal to or less than a predetermined threshold, the worker determines that the inspection object 11 is a non-defective product. On the other hand, when the difference exceeds the threshold value, the inspection object 11 is determined to be a defective product, the cause of the failure is analyzed, and the result is fed back to the previous process (electrode process). [Selection] Figure 5 |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-7296217-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2015087390-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2020139819-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-5918390-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-107276534-A |
| priorityDate | 2010-08-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID415753900 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID74442 |
Total number of triples: 22.