http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2012032160-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1476752f2420c8f8eb53464cf7fc922b |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01G4-33 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-00 |
| filingDate | 2010-07-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8a32b3dce782ab6f9de531c20047ef3d |
| publicationDate | 2012-02-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2012032160-A |
| titleOfInvention | Method for evaluating characteristics of electronic components |
| abstract | An electronic component characteristic evaluation method capable of evaluating physical properties inside the electronic component and contributing to the characteristic analysis of the electronic component is realized. For a ceramic capacitor in which electrodes 3a and 3b are formed on both ends of a dielectric ceramic 2, a probe 4 having a metal part 7 on the surface is connected to the surface of the dielectric ceramic 2 with one electrode 3b (cathode). ), A plurality of different voltages are applied between the probe 4 and the electrode 3b, the current value is measured, the current-voltage characteristic is fitted to the Fowler-Nordheim equation, and the Schottky barrier height is increased. is estimates the phi, further calculates the depletion layer width w and the oxygen defect concentration N D, thereby evaluate the characteristics of the electronic component. [Selection] Figure 3 |
| priorityDate | 2010-07-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 16.