http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2011007788-A

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filingDate 2010-06-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_abc55815c12379c6e9e68625963a726e
publicationDate 2011-01-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2011007788-A
titleOfInvention Specimen test strip with combined electrical contacts and instrument identification
abstract A specimen test strip for use with a test meter is determined to be suitable for use with the test meter. An analyte test strip includes a first insulating layer and a conductive layer provided on the first insulating layer. The conductive layer has at least one electrode portion and at least one electrical contact pad 112a, 112b that is electrically connected to the electrical connector pins of the test meter during insertion of the analyte test strip into the test meter. It is configured to move along the contact pad. In addition, the electrical contact pad is in electrical communication with the electrode portion. The analyte test strip also includes at least one instrument identification mechanism 116a, 116b that is configured so that the electrical connector pin of the test instrument traverses the instrument identification mechanism during insertion of the analyte test strip into the test meter. An electrical contact pad is provided for movement. [Selection] Figure 1
priorityDate 2009-06-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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