Predicate |
Object |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C08F220-382 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C08F220-325 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C08F220-1805 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03F7-0382 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C08F220-18 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03F7-0002 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03F7-0047 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03F7-004 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03F7-0045 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C08F220-38 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-027 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F7-004 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F7-038 |
filingDate |
2009-02-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate |
2010-12-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
JP-2010538155-A |
titleOfInvention |
Copolymer for resist containing photoacid generator and method for producing the same |
abstract |
A resist copolymer containing a photoacid generator and a method for producing the same are provided. A copolymer that can be used as a resist for AFM lithography or a resist for electron beam lithography, and a method for producing the same, and has excellent solubility and coating properties in an organic solvent, and is capable of further improving pattern formation in a lithography process. A copolymer containing a photoacid generator of an alkylsulfonium salt and a method for producing the same. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2014019741-A |
priorityDate |
2008-08-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |