http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2010517015-A

Outgoing Links

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classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F2218-10
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F18-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01T1-161
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-25
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-28
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01T1-36
filingDate 2008-01-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2010-05-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2010517015-A
titleOfInvention Advanced pattern recognition system for spectral analysis.
abstract In the process of rapid and very accurate analysis of spectral data, both the linear scan (LINSCAN) method for pattern recognition and the advanced peak detection method are included. One or both methods are used to aid in the detection and identification of chemicals, organisms, radioactive materials, nuclear power and explosives. The spectra of various targets can be analyzed by two spectral analysis methods. These two methods can be combined as compared to what can be done alone to reduce double validation, better accuracy, and false positives and missed detections. [Selection] Figure 5
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2021004747-A
priorityDate 2007-01-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2006170791-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H09276257-A
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID425788590
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID10408

Total number of triples: 19.