http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2010517015-A
Outgoing Links
Predicate | Object |
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classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F2218-10 |
classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F18-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01T1-161 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-25 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-28 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01T1-36 |
filingDate | 2008-01-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate | 2010-05-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | JP-2010517015-A |
titleOfInvention | Advanced pattern recognition system for spectral analysis. |
abstract | In the process of rapid and very accurate analysis of spectral data, both the linear scan (LINSCAN) method for pattern recognition and the advanced peak detection method are included. One or both methods are used to aid in the detection and identification of chemicals, organisms, radioactive materials, nuclear power and explosives. The spectra of various targets can be analyzed by two spectral analysis methods. These two methods can be combined as compared to what can be done alone to reduce double validation, better accuracy, and false positives and missed detections. [Selection] Figure 5 |
isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2021004747-A |
priorityDate | 2007-01-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 19.