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publicationDate 2010-07-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2010165705-A
titleOfInvention Manufacturing method of semiconductor device
abstract PROBLEM TO BE SOLVED: To make an equivalent oxide film thickness difficult when an alumina film is stacked on a gate insulating film made of hafnium silicate. In addition, when Al diffuses into the gate insulating film made of hafnium silicate, the hole mobility decreases. An insulating film (16) containing Hf and O is formed on a semiconductor substrate (10). A cap film (17) containing oxygen and titanium as constituent elements is formed on the insulating film. The gate insulating film (18) is formed by heat-treating the insulating film and the cap film in a nitrogen gas or rare gas atmosphere to diffuse titanium in the cap film into the insulating film. A gate electrode film (19) is formed on the gate insulating film. [Selection] Figure 1-2
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