http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2010127943-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6468b86e8fb75499726f72ecdeb759d1 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_f1fa533d63be7d4ec4cc2cdb0887d382 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B08B7-0028 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R3-00 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2009-12-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_604bb1311abf94f28a866aec0fc0a088 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_605094d370a1c8d3dcf9b09f74797486 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3383b922a5324e7523197b7adda24f83 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8ec8a8326abbddc10015ca94b6ece952 |
| publicationDate | 2010-06-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2010127943-A |
| titleOfInvention | Pin element on mounting board, electrical interface receptacle TCC cleaning device (testcellconditioner (TCC) surrogate cleaning device) and cleaning method |
| abstract | Development of a cleaning TCC cleaning device and a cleaning method for cleaning a pin element and a test chip receptacle of an IC device to keep the tip of a test probe clean. The apparatus of the present invention includes a main test frame, a plurality of dishes, a chip test receptacle, and one or more pick / retainers. The waiting test chip (electronic element) is mounted on a plate, and the plurality of adhesive cleaning chips are mounted on another plate. The adhesive cleaning tip includes a solid layer and an adhesive layer, and the latter is mixed with a friction material. The pick-up / restor is moved to a position above the adhesive cleaning tip / test / receptacle and cleans oxides and other contaminants attached to the receptacle by blotting or rubbing. The work efficiency is improved without interrupting the equipment work for cleaning the test probe by etching. [Selection] Figure 1 |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2017010937-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101374842-B1 |
| priorityDate | 2008-12-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 25.