http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2009270835-A

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Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9ec030fc062b270c25327af9127bed3a
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2008-04-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_423ee3f7dd8122a78bf25ffc780501ce
publicationDate 2009-11-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2009270835-A
titleOfInvention Inspection method and apparatus for semiconductor parts
abstract When inspecting a large number of semiconductor components such as LSIs and semiconductor modules, an inspection apparatus capable of performing simultaneous measurement with high accuracy even when the number of objects to be inspected or the number of measurement points increases is obtained. A plurality of probe contacts (22) capable of contacting an object to be inspected (10) are formed on a first surface of an insulating substrate (11), and a plurality of first electrode terminals (23) are formed on a second surface. The probe substrate (10) formed and electrically connected between the probe contact and the first electrode terminal by a plurality of through electrodes (24), and rewritable hardware can be mounted or built in, on one side A control board (30) having a plurality of second electrode terminals (33) connected to the hardware, and a first electrode terminal of the probe board and a second electrode terminal of the control board, which are interposed between each other. A plurality of electrically conductive buffer materials (26) that are electrically connected. [Selection] Figure 3A
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8957693-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2011252773-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101959484-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2013088288-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2011041158-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2015090363-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8911266-B2
priorityDate 2008-04-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 22.