Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d9cb217f83556ce2a418344c2d485415 |
classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B29L7-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B29L9-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B29K79-00 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B29C41-52 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B29C41-32 |
filingDate |
2008-03-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_236f96d8ffc87f69973b64d297d20bbd http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_738b9c9495230dfdea7a4ee4819b30e0 |
publicationDate |
2009-10-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
JP-2009241329-A |
titleOfInvention |
Manufacturing method of multilayer polyimide film |
abstract |
An object of the present invention is to find out the occurrence of unevenness in the thickness of a film surface layer in the middle of production at an early stage, and use this result to extrude a base material layer and a polyimide precursor solution of the surface layer to a support from a multilayer die. Providing a method for producing a multilayer polyimide film for the purpose of preventing the occurrence of uneven thickness of the surface layer by controlling the amount of extrusion of the polyimide precursor solution to be uniform. A method for producing a multilayer polyimide film, in which the thickness unevenness of a film surface layer is measured during the production by a method selected from a schlieren method and a shadow graph method, and the amount of polyimide precursor solution extruded on the surface layer portion is uniform. A process for producing a multilayer polyimide film, which is controlled to be [Selection figure] None |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2009280694-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-WO2012132986-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101757498-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-103442870-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2012132986-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-103442870-B http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-5668694-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9276139-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2015172565-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2011093245-A1 |
priorityDate |
2008-03-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |