http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2009236511-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_ec3af9072cf2cdc7a99f55c1775f8091
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
filingDate 2008-03-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_90a68b11877b48ecb3134af14fe879c6
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9bd4aacd2b8e48180e3840a1f7346fd2
publicationDate 2009-10-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2009236511-A
titleOfInvention Probe card and semiconductor test equipment
abstract An object of the present invention is to efficiently perform a characteristic test of a plurality of types of semiconductor elements to realize cost reduction. A probe card substrate, a plurality of probe card substrates mounted on the probe card substrate, and a plurality of probe pins supported by the probe card substrate are provided. A probe card 10 is provided. Further, by rotating the probe card substrate 20 of the probe card 10, the probe card substrate 30 used in the probe test is selected, and the tip of the probe pin 31 supported by the selected probe card substrate 30 is connected to the probe card substrate 20. It can be made to protrude from the main surface. [Selection] Figure 1
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2013105920-A
priorityDate 2008-03-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID415777387
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID83648

Total number of triples: 17.