http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2009204462-A

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_be92719b856db86c092cc233e9512ca2
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03G5-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B21-30
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filingDate 2008-02-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_43b00aff439bc1bfb1172aadca45659b
publicationDate 2009-09-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2009204462-A
titleOfInvention Method for evaluating surface shape of parts for electrophotographic apparatus such as electrophotographic photosensitive member
abstract To provide a method for evaluating the surface shape of a part for an electrophotographic apparatus such as an electrophotographic photosensitive member in more detail than a conventional method. A one-dimensional data array obtained by measuring a surface roughness of a part for an electrophotographic apparatus such as an electrophotographic photosensitive member with a surface roughness meter is subjected to wavelet transform from a high frequency component to a low frequency component. Performs multi-resolution analysis that separates into multiple frequency components, and further creates a one-dimensional data array by thinning out the lowest frequency component obtained here, and further performs wavelet transform on this one-dimensional data array to obtain high-frequency components. A multi-resolution analysis is performed to separate a plurality of frequency components from 1 to a low frequency component, and a ten-point average roughness and a maximum height are obtained from the obtained multi-resolution analysis result. [Selection figure] None
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priorityDate 2008-02-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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