http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2009198292-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b8ca6ee864e0448264aa0f90630b89c3 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2008-02-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_148f43a90ee3328c0d5bd3456df79074 |
| publicationDate | 2009-09-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2009198292-A |
| titleOfInvention | Semiconductor test equipment |
| abstract | A semiconductor test apparatus capable of reducing test time by reducing overhead time generated by using software. In a semiconductor test apparatus for performing a test by setting test condition data in hardware, a storage unit for storing the test condition data and a test condition data stored in the storage unit are selected and output for each item. And a setting unit that sets the test condition data output from the selection output unit in hardware. [Selection] Figure 1 |
| priorityDate | 2008-02-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID39859 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID447920381 |
Total number of triples: 13.