| abstract |
A method for analyzing a minute amount of a noble metal with a high-frequency plasma mass spectrometer with high accuracy without performing a prior separation operation is provided. (1) a step of preparing a solid sample or a liquid sample containing 500 to 5000 ppm by mass of Na; (2) in the case of a solid sample, the sample is pretreated by an alkali melting method using a sodium compound; A step of preparing a sample solution containing Na of 500 to 5000 ppm by mass; and (3) a high-frequency plasma mass comprising a liquid sample or sample solution having an interface part having a skimmer cone and an ion lens part having a three-stage ion lens. Analyzing with an analyzer, and in step (3), the applied voltage to the first stage ion lens closest to the interface unit is set to 0 V, and the second and third stage applied voltages are applied. A method for analyzing a noble metal contained in a sample, wherein the sensitivity is adjusted by the method. [Selection figure] None |