http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2009128190-A

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_30e3d3033a789d6a8c0ad34b140b492f
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2007-11-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c99b75ced29afc66fdd67b35e600d6eb
publicationDate 2009-06-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2009128190-A
titleOfInvention Element testing apparatus and element testing method
abstract An element test apparatus that improves the productivity of a semiconductor device and realizes cost reduction is provided. A support base 11 for supporting a semiconductor element 20, a woven or non-woven conductive sheet 30s in surface contact with an emitter electrode 20e disposed on the semiconductor element 20, and a conductive material in contact with the main electrode. At least one contact pin 30g that is in contact with a pressure mechanism 30p that applies a load to the sheet 30s, an elastic layer 30e that is interposed between the conductive sheet 30s and the pressure mechanism 30p, and a control electrode of the semiconductor element 20. An element test apparatus 1 having the following is provided. Thereby, the productivity of the semiconductor device is improved and the cost is reduced. [Selection] Figure 1
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2023167013-A1
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Total number of triples: 31.