http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2009081268-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_fd83260a96356882b5f50dd097411a72
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-0002
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-09701
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-585
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-12
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-52
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3205
filingDate 2007-09-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c73269e0a7e2310c7df59b05340b5bb0
publicationDate 2009-04-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2009081268-A
titleOfInvention Evaluation pattern of occurrence state of hillock, substrate provided with the same, and evaluation method
abstract An object of the present invention is to provide an evaluation pattern, a semiconductor substrate including the evaluation pattern, and an evaluation method that can more efficiently grasp the occurrence of hillocks. An evaluation pattern 11 according to the present invention is an evaluation pattern 11 for evaluating the occurrence of hillocks 4 and includes an annular wiring 13a having a predetermined wiring width W1 formed in an upper layer of an insulating film 12, and an annular wiring 13a. Grid pattern 13 having a number of grid wirings 13b that connect two opposing points vertically and horizontally, and an isolated wiring 14 disposed between the grids with an annular wiring 13a and a predetermined gap dimension L1. . [Selection] Figure 1
priorityDate 2007-09-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H05315335-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H08115914-A
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5359268
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419491804

Total number of triples: 20.