http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2009069045-A
Outgoing Links
Predicate | Object |
---|---|
assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_cdd94f212dc7aef02fc1dcf28fa9b4fd |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-90 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-72 |
filingDate | 2007-09-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_56c008df90d000c3cfbe371edbad6b47 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_21d7266be9753fd6316133326fa9ba68 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e9db4cf4aa684b100b29cbd507248fb5 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9beeef9c6454a1752fd15c4a90b2705f |
publicationDate | 2009-04-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | JP-2009069045-A |
titleOfInvention | Inspection method of translucent conductive thin film and translucent conductive thin film |
abstract | Provided is a method for simply and quickly inspecting a conductive pattern of a translucent conductive thin film, an abnormal conductivity, etc., and accurately inspecting the translucent conductive thin film to be measured without damaging it. To do. A flexible film coated with a photosensitive silver halide emulsion layer is exposed to a mesh pattern with a line width of 0.5 to 30 μm, developed, and then subjected to electrolytic plating. In the method for inspecting a light-transmitting conductive thin film on which a conductive pattern is formed, the surface resistivity of the light-transmitting conductive thin film is measured in a non-contact manner. A method for inspecting a light-transmitting conductive thin film and a light-transmitting conductive thin film. [Selection figure] None |
priorityDate | 2007-09-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 301.