| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6c8d4dc7bd1a30d8fda907fceaeb4e69 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-207
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-62
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-04 |
| filingDate |
2007-06-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fab4ef92790bab93ebf94ab6191f1d47
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c39d9262e197ba5b3f460340b9103f1d |
| publicationDate |
2009-01-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
JP-2009008500-A |
| titleOfInvention |
Crystal dislocation evaluation method, crystal growth method evaluation method and crystal growth method |
| abstract |
Disclosed is a method for simply and accurately evaluating dislocations without breaking crystals. By irradiating the surface of the crystal sample with X-rays, a horizontal intensity distribution curve from the asymmetrical diffraction surface of the crystal sample in a reciprocal lattice space is created, and the half-value width of the intensity distribution curve is used to generate the crystal sample. Evaluate dislocations. [Selection figure] None |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108701623-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108701623-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-106055899-A |
| priorityDate |
2007-06-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |