http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2008261649-A
Outgoing Links
Predicate | Object |
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assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_294881271413951a95f284b588a68e66 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-27 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-41 |
filingDate | 2007-04-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0154d89aa245f4358c7099ba894f5dc4 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6d1451a2be0f82420daa2ec9e8310965 |
publicationDate | 2008-10-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | JP-2008261649-A |
titleOfInvention | Dielectric constant measurement method based on attenuated total reflection spectroscopy |
abstract | To provide a method for more accurately measuring the dielectric constant of a sample to be measured from spectral data obtained by an attenuated total reflection spectroscopy technique. A method of measuring a dielectric constant of a sample to be measured from spectral data obtained by an Attenuated Total Reflection (ATR) spectroscopic method. As a standard sample used in the method, a general “air” In this case, a material having a constant dielectric constant in a predetermined frequency region band of incident electromagnetic waves is employed. [Selection] Figure 1 |
isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2019153460-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2017194361-A |
priorityDate | 2007-04-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 20.