http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2008261649-A

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_294881271413951a95f284b588a68e66
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-27
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-41
filingDate 2007-04-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0154d89aa245f4358c7099ba894f5dc4
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6d1451a2be0f82420daa2ec9e8310965
publicationDate 2008-10-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2008261649-A
titleOfInvention Dielectric constant measurement method based on attenuated total reflection spectroscopy
abstract To provide a method for more accurately measuring the dielectric constant of a sample to be measured from spectral data obtained by an attenuated total reflection spectroscopy technique. A method of measuring a dielectric constant of a sample to be measured from spectral data obtained by an Attenuated Total Reflection (ATR) spectroscopic method. As a standard sample used in the method, a general “air” In this case, a material having a constant dielectric constant in a predetermined frequency region band of incident electromagnetic waves is employed. [Selection] Figure 1
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2019153460-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2017194361-A
priorityDate 2007-04-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 20.