http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2008224570-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_be055db3c1a09879df07379ba969e223 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-22 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N30-88 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N30-06 |
| filingDate | 2007-03-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f6b816a8b4229825688f1a40081750a2 |
| publicationDate | 2008-09-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2008224570-A |
| titleOfInvention | Plastic component inspection apparatus and component inspection method |
| abstract | In order to continuously inspect components of halogen compounds contained in plastic materials, it takes time for pretreatment. A sample chamber 20 that holds a sample holding portion that holds a sample holding portion inactive with respect to decabromodiphenyl ether in an inspection temperature range and a sample table 11 on which the sample chamber 20 is placed are fixed up and down. A needle 13 to be moved, a heater 12 for heating the sample chamber 20 via the test tube 10, and an analyzer 15 for analyzing the decabromodiphenyl ether gas generated from the sample by heating while refluxing to the carrier gas 18. With the plastic component inspection apparatus 1, decabromodiphenyl ether contained in a plastic material can be inspected continuously in a short time. [Selection] Figure 1 |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2015021930-A |
| priorityDate | 2007-03-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 28.