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filingDate 2007-02-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e16c870a23cedc6aafcd5698591ced19
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publicationDate 2008-08-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2008199270-A
titleOfInvention Solid-state imaging device, imaging device
abstract In a solid-state imaging device employing a reference signal comparison AD conversion system, an increase in the speed of AD conversion processing and reduction in power consumption are achieved while suppressing an increase in circuit area. A two-type reference signal Vslop that changes in 2 LSB steps and has a level difference of 1 LSB is prepared. The reference signal Vslop_2 having the lower level is compared with the pixel signal voltage Vx, and the count value T when the comparison pulse COMP is inverted is held. The pixel data D is determined by switching to the reference signal Vslop_1, comparing again with the pixel signal voltage Vx, and correcting the count value T held based on the comparison result. When “pixel signal voltage Vxα> reference signal Vslop_1 (T)”, D = 2T−1, and when “pixel signal voltage Vxα <reference signal Vslop_1 (T)”, D = 2T. Since the comparison period required for AD conversion is halved, the AD conversion processing can be doubled while maintaining the bit resolution and suppressing an increase in power consumption. [Selection] Figure 7
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