http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2008141111-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_7af673589ca45d2fd8b9ea902cdbd1dc |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-336 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-78 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2006-12-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bfd46c0e4bbe0b3c45a7c42ea18455ec http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_54566d8d82dec4d188b11d9ded397552 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3101e8a04ca47613b9fa1a5a9dec868e |
| publicationDate | 2008-06-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2008141111-A |
| titleOfInvention | Semiconductor device and chip crack inspection method for semiconductor device |
| abstract | A semiconductor device capable of electrically and accurately detecting a crack generated in a chip of a power MOSFET in an assembly process. An inspection insulating film is formed along the outer side of a drain wiring provided along the outer periphery of a chip, and an inspection wiring is provided on the inspection insulating film. If a voltage is applied between the drain wiring 23 and the inspection wiring 22 via the drain lead 40 and the inspection lead 43 and the leakage current between them is measured, cracks are generated in the peripheral portion of the chip 21 according to the magnitude of the voltage. It can be easily determined whether or not it has occurred. [Selection] Figure 1 |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2012038925-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2019021740-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2013057589-A |
| priorityDate | 2006-12-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5359268 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419491804 |
Total number of triples: 20.