http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2008116361-A

Outgoing Links

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_7af673589ca45d2fd8b9ea902cdbd1dc
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-762
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-76
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2006-11-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_910e66f66ece335618a121858efe1e1c
publicationDate 2008-05-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2008116361-A
titleOfInvention Semiconductor device sorting method and semiconductor device
abstract Kind Code: A1 A semiconductor device selection method and a semiconductor device capable of guaranteeing the withstand voltage performance of an insulating film constituting an SOI structure semiconductor substrate are provided. A low-voltage circuit region having a low-voltage element is surrounded by an insulating isolation trench that reaches an insulating film in a main surface side surface layer portion of a semiconductor layer constituting an SOI structure semiconductor substrate. The high-voltage circuit region 300 having the element 301 is surrounded by the insulating isolation trench 501 reaching the insulating film 20, and the high-voltage side field region f1 surrounded by the innermost insulating isolation trench 501 and the innermost far-away isolation trench 500. By applying an arbitrary voltage between the low voltage side field region f2 surrounded by, a breakdown voltage of the insulating film 20 corresponding to the high voltage side field region f1 and the low voltage side field region f2 is guaranteed. [Selection] Figure 3
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2010080803-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-102683262-A
priorityDate 2006-11-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 21.