http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2008059719-A

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C11-401
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C29-12
filingDate 2006-09-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_01d8b0291b2036440274523ca78fc622
publicationDate 2008-03-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2008059719-A
titleOfInvention Semiconductor memory device
abstract An object of the present invention is to easily check data writing and reading to a memory bank. A W amplifier / D amplifier 72 reads test data from a memory bank 80, and a W amplifier / D amplifier 73 reads test data from a memory bank 90. The read data comparison circuit 75 compares the test data read from the W amplifier / D amplifier 72 or the W amplifier / D amplifier 73 with the expected value of the test data, and the test data and the expected value are all identical. Outputs a signal indicating whether or not [Selection] Figure 2
priorityDate 2006-09-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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