http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2008039650-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b69fc718549d62a30f21ca08ce92d95b |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073 |
| filingDate | 2006-08-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3b64f6607c4ed3388f715ea0ee3c2581 |
| publicationDate | 2008-02-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2008039650-A |
| titleOfInvention | Test contact |
| abstract | Provided is a test contact capable of accurately bringing a contact into contact with an electrode of a semiconductor component on which an insulating oxide film is formed, enabling accurate electrical measurement and inspection, and improving yield. A contact 2 has a bent portion 4 such that a tip portion thereof is inclined upward, that is, toward a side where a semiconductor component held in a holding pore is inserted in an electrical characteristic inspection step. Since the tip of the contact 2 is bent and inclined, when the semiconductor component is pressed against the contact 2, the tip of the contact 2 moves while contacting the electrode of the semiconductor component. [Selection] Figure 1 |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2016090306-A |
| priorityDate | 2006-08-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 19.