http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007335550-A

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filingDate 2006-06-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2007-12-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2007335550-A
titleOfInvention Semiconductor device
abstract PROBLEM TO BE SOLVED: To provide a semiconductor device having a probing deviation detection pattern that has a small occupation area and can detect a direction in addition to a positional deviation amount. SOLUTION: Two probing displacement detection patterns are arranged in pairs in a scribe area adjacent to an IC chip. The probing misalignment detection pattern includes an inner conductor formed on a concentric circle and an outer conductor disposed at a minute interval from the inner conductor. The structure was divided. By these means, when a misalignment of the needle occurs during probing, a semiconductor device in which a probing misalignment detection pattern capable of detecting the misalignment direction is formed with a small occupied area can be obtained. [Selection] Figure 1
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