http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007205919-A

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filingDate 2006-02-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_41abccd6e0bf2cda9dc09aa99125a864
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publicationDate 2007-08-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2007205919-A
titleOfInvention Circuit board device for wafer inspection, probe card, and wafer inspection device
abstract A circuit board device for wafer inspection for collectively inspecting a large number of integrated circuits, which can be manufactured at a low cost, and the circuit board device for wafer inspection Provided are a probe card and a wafer inspection apparatus. A connector unit in a connector device, comprising: a substrate body comprising a wiring board having connection electrodes on the surface; and a connector device provided on the surface of the substrate body, wherein a plurality of connector units are stacked. Each has an anisotropic conductive elastomer sheet, and a pitch conversion board that is arranged on the anisotropic conductive elastomer sheet and includes a wiring board having a connection electrode on the front surface and a terminal electrode on the back surface, Each of the connection electrode of the substrate body and the connection electrode of the pitch conversion board is electrically connected to the terminal electrode of the pitch conversion board arranged immediately above via an anisotropic conductive elastomer sheet. [Selection] Figure 2
priorityDate 2006-02-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 22.