http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007196261-A

Outgoing Links

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b576861ef2bbff1956483170b6360884
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B21B38-02
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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B21C51-00
filingDate 2006-01-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f5bda753835a83ceb4b712cb6ebb6594
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_076638a27e482c6b154afd5b630f1b2e
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publicationDate 2007-08-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2007196261-A
titleOfInvention Method and apparatus for detecting and controlling edge drop in cold rolling
abstract Highly accurate edge drop control is performed by a scanning profile meter using an inexpensive γ-ray thickness meter. A fixed-type and scanning-type thickness measuring device using a γ-ray source is arranged on the inlet side of a cold rolling mill row 6 and the fixed-type thickness measuring device 2 determines the thickness of the central portion of a strip 1. On the other hand, the scanning type thickness measuring device 3 changes the shift position of the work roll 7 using the thickness profile in the width direction measured by mechanically scanning the strip 1 in the width direction of the strip 1. When performing feedforward control, the plate thickness profile estimated using the measured values of the γ ray thickness meter inside the plate width end is used for the plate thickness profile of the plate width end where the accuracy of the γ ray thickness meter is not guaranteed. use. [Selection] Figure 3
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-2656933-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114505353-A
priorityDate 2006-01-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 20.