http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007155553-A

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filingDate 2005-12-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7d3a34e3e2172378a1ec7a72fd1003a1
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publicationDate 2007-06-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2007155553-A
titleOfInvention Probe pin, probe card and probe device
abstract To prolong the life of a probe pin. A contact portion 31 of a probe pin 10 is formed of tin having a lower strength than an electrode P of a wafer W. By doing so, when the probe pin 10 is pulled away from the electrode P, the probe pin 10 side is broken and lost, so that a part of the electrode P can be prevented from adhering to the probe pin 10. The probe device can be provided with a container for storing molten tin. The container can be moved three-dimensionally by a moving mechanism, and the probe pin 10 can be immersed in the molten tin in the container. As a result, tin can be replenished on the surface of the missing probe pin 10. [Selection] Figure 6
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2011179842-A
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Total number of triples: 26.