http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007064925-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_be055db3c1a09879df07379ba969e223
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2005-09-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_59655d3809e1521563616c36b40e7717
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2797a04ddc47c7166939d2b22bf105a0
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4b96cab2c9c955cfffb0fc97985b252c
publicationDate 2007-03-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2007064925-A
titleOfInvention Electronic component testing equipment
abstract An object of the present invention is to provide an electronic component testing apparatus capable of improving the efficiency of testing work and ensuring high testing accuracy. In an electronic component testing apparatus for testing an electronic component under a predetermined temperature environment, a carrier having a lead frame on which a plurality of electronic components including a light emitting element are mounted is mounted on a socket. Hold. The heat transfer section 30 having a structure in which the thin plate 33 provided with the convex portions 33a corresponding to the position of the electronic component 12 is connected to the heat transfer block 31 via the elastic sheet 36 is connected to the one end side of the Peltier element and contacted. An expression temperature adjustment unit is configured. The contact-type temperature control unit is attached to a cover that can be opened and closed with respect to the socket 9, and the convex part 33 a of the heat transfer unit 30 is brought into contact with the electronic component 12 by closing the cover, thereby transferring heat from the Peltier element. It transmits to the electronic component 12 through the heat block 31, the elastic sheet 36, and the convex part 33a, and temperature adjustment at the time of a test is performed. [Selection] Figure 10
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I576561-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2021167878-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2014109544-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I603101-B
priorityDate 2005-09-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541

Total number of triples: 18.