http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007059668-A

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-027
filingDate 2005-08-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_836459dc17622ce1138a2b8b0f5ff5d6
publicationDate 2007-03-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2007059668-A
titleOfInvention Manufacturing method of semiconductor device
abstract A low-cost manufacturing method of a semiconductor device capable of forming a highly accurate pattern using a printed resist film is provided. A printing resist film containing particle components is formed with high precision on the outer periphery of a wafer, and the wafer is thinned by removing the surface of the wafer using the mask as a mask. Thereafter, toluene 16 is sprayed from the discharge nozzle 15 and the particle removing member 19 is pressed against the outer peripheral portion of the rotating wafer 6 to remove the remaining particle component 18 of the printed resist film. By using a printing resist material containing particle components, thixotropy can be obtained and a highly accurate pattern can be formed at low cost. [Selection] Figure 8
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Total number of triples: 24.