http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007035899-A

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-67103
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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-683
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
filingDate 2005-07-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_98a5655f9d3dad1894493a2b3dc75374
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publicationDate 2007-02-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2007035899-A
titleOfInvention Wafer holder for wafer prober and wafer prober mounted therewith
abstract PROBLEM TO BE SOLVED: To provide a wafer holder, a heater unit thereof, and a wafer prober on which the wafer holder is mounted, which can improve the heat uniformity of the wafer without misalignment of the wafer placed on the wafer placement surface at the chuck top. A wafer holder (1) having a chuck top (2) for mounting and fixing a wafer and a support (4) for supporting the chuck top (2), wherein the water absorption rate of the chuck top (2) is 0.01% or more. Or preferably 0.1% or more. The material of the chuck top 2 is preferably a composite of metal and ceramics, in particular, a composite of aluminum and silicon carbide or a composite of silicon and silicon carbide. [Selection] Figure 1
priorityDate 2005-07-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 29.