http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2006525132-A

Outgoing Links

Predicate Object
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T428-24917
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81B2201-025
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01P2015-0814
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81B7-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01P15-0802
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81B3-0078
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01P15-08
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23F1-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01P3-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B32B9-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01P15-0888
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B81B3-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01P15-08
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B32B15-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01P3-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B32B9-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L-
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23F1-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B81C1-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01P9-04
filingDate 2004-04-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2006-11-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2006525132-A
titleOfInvention Method for adding mass to a MEMS structure
abstract A proof mass (11) for a MEMS device is disclosed herein. The proof mass includes a base portion (13) made of a semiconductor material and one or more attachment portions (15) attached to the base portion via a shaft portion (21). The appendage (15) comprises a metal (17) or other material that can be disposed on the semiconductor material (19). By using a metal, the total mass of the proof mass (11) is increased without increasing the size of the proof mass compared to a proof mass of similar size made from semiconductor material only. At the same time, by joining the attachment portion (15) via the shaft portion (21), it is prevented that the CTE difference of the attachment portion is transmitted to the base portion that can contribute to the temperature error and stress is generated.
priorityDate 2003-04-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H11271351-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2000088878-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2003050249-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H06258338-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2000183364-A
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23985
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5359268
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419491804
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID482532689

Total number of triples: 36.